Scanning Electron Microscope

The laboratory has one FEI Quanta FEG 250 electron microscope which can be booked for assisted and independent imaging. The FEI Quanta addresses the need to examine a wide range of materials and characterize structure and composition by providing unrivalled flexibility to enhance both performance and adaptability to meet the demands of today's diverse research needs.

Summary of features:

Everhardt Thornley SED (secondary electron detector

4 quadrant solid-state BSED

In-column detector (ICD) for secondary electrons in BD mode*

Oxford EDS on INCA software

Oxford EBSD detector on AzTEc platform


- High vacuum – 0.8 nm at 30 kV

- SE – 2.5 nm at 30 kV

- BSE – 3.0 nm at 1 kV (SE)