Transmission Electron Microscope
The 200 kV FEG FEI Tecnai G2 F20 TEM is designed for high-end conventional and high resolution TEM work on a diverse variety of materials science challenges, including nanomaterials, metal alloys, polymers, ceramics, and minerals.
- Brightfield Imaging
- Darkfield Imaging
- Selected Area Electron Diffraction (SAED)
- Elemental analysis can be performed using energy-dispersive spectroscopy point analysis
High resolution TEM/ Imaging mode has point to point resolution < 0.25 nm and line to line resolution < 0.10 nm.